1083
Subject Index
2-hydroxyethyl methacrylate
(HEMA) 209
3-D digital image correlation
589
A
B
background intensity 491, 515
backing 292
balanced mode 290
ball grid array (BGA) 1022
ballast gage 287
ballast resistor 286
ballistic impact 929
basic fringe pattern 552
beam-splitter (BS) 678
beam-splitter (DBS)
– directional 683
beat frequency 466
bending moment 1006
Bessel fringe
– J0 fringe 681
biaxial analysis 805
biaxial loading 295
biaxial stress measurement 813
bilinear 574
bimaterial constant 962
bimaterial corner 966, 977, 978
binomial 263
biological
– beam 1012
– material 438
– sample 410
biomaterial 817
biomechanics
– definition 182
– history 169
biomolecular recognition device
222
birefringence 702, 704, 973
black body 748, 751
blast and explosive load
994
blister 980
bloodborne pathogens 871
body force 734
body-centered cubic (bcc) 24
Bogen tripod 586
Boltzmann’s constant 745
bonded joint 978
bottom-up strategy 551
boule 325
boundary condition 734
boundary layer 194, 199
boundary, initial, and loading (BIL)
682
box-kernel 498
Bragg grating (FBG)
– fiber 361, 906
Bragg wavelength 363
branch cut algorithm 727
bridge 1002
bright field 708
Brillouin frequency shift 359
Brillouin scattering 359
Brinell hardness number (BHN)
390
British Standards Institute (BSI)
102
bromoundecyltrichlorosilane
(BrUTS) 974
buckyball 210
bulge 980
bulk wave
– flaw imaging 789
bundle adjustment 573
burst pressure 1009
Subject Index
absolute phase measurement 495,
532
absolute shape 682
AC measurement 413
accelerated life testing (ALT) 1016
accelerometer 693
accident 1009
accuracy and resolution 990
accurate clear epoxy solid (ACES)
733
active material 209
additive intensity 603, 604
additive moiré 605
adhesion 220, 221, 961
– measurement technique 220
– prevention of 220
adhesive fracture 961, 962
adiabatic response 747
adiabatic shear band 952
adiabaticity 752
advanced photon source (APS) 810
advancing side 586
AFM
– /DIC method 436
– /DIC strain measurement 435
– cantilever 411, 414
– contact 411, 413, 423
– instrumentation 409
– metrology 411
– probe 412, 414
Airy disc 475
aluminum 208
ambiguity 708, 724
American Association of State
Highway Transportation Officials
(AASHTO) 991
American Bureau of Shipping (ABS)
367
American Institute of Steel
Construction (AISC) 991
American Railway Engineering
Association (AREA) 991
American Society for Testing and
Materials (ASTM) 102, 284, 991,
998, 1001
amorphous material 817
amorphous silicon 207
amplification 610
amplitude 708
amplitude grating 601
amplitude modulation 427
analog camera 567
analog-to-digital converter 412
analytical, computational, and
experimental solutions (ACES)
688
analyzer 706, 712
animation of experimental data 688
anisotropic 97
anisotropy
– elastic 804
aperture effect 618, 619
applied strain 293
articulated truck 1002
assembly stress 704
assembly stress/residual stress 703
Association Française de National
(AFNOR) 102
atomic force microscopy (AFM)
216, 220, 397, 409–411, 846
atomic resolution 412, 424, 431
atomic structure 18, 40
attractive force 412
automotive airbag 987
1084
Subject Index
C
Subject Index
calcium-fluoride-coated window
758
calculation of the form 278
calibration 748, 996
– of a photoelastic material 709
– of cantilever stiffness 415
– of the coating material 716
camera calibration 572, 594
camera calibration procedure 572
camera coordinate system 569
cantilever
– dynamics 411
– oscillation amplitude 429
– spring constant 414
– thermal fluctuation 416
– tip 417
– tip artifact 411
capacitance 194, 199
capacitive coupling 286
capillary adhesion 433
capillary force 212, 433
carbon nanotube (CNT) 107, 210,
920
carrier-frequency method 492, 512
cast polyimide 311
cedip 746
celanese compression fixture 104
cell 438, 439
central tendency 260
ceramic ball grid array (CBGA)
646, 1032
ceramic matrix composite (CMC)
22, 909
challenge 1002
characteristic
– function 485
– parameter 713
– relation 932
– retardation 712
– rotation 712
charge density 194
charge-coupled device (CCD) 567,
745, 752
Charpy impact 953
Chauvenet’s method 272
chemical shrinkage 117
chemical vapor deposition (CVD)
208, 210, 211, 214
chemical–mechanical polishing
(CMP) 1031
chirped grating 367
chi-square (χ 2 ) 263
– statistic 277
– test 277
Christoffel equation 771
chromium 208
circular polariscope 708
circularly polarized 704
civil structural monitoring 368
classification of structural testing
991
cleveland method 415
closed-loop system 995
C-mode scanning acoustic
microscopy (CSAM) 1023
coating 751, 782
coating and thin film 809
coefficient of hygroscopic swelling
(CHS) 648
coefficient of thermal expansion
(CTE) 117, 622, 757, 1016, 1018
coefficient of variation 263
coherent gradient sensing (CGS)
150, 969, 970, 1030, 1031
coherent imaging 487
coherent optical data processing
478
cohesive fracture 961
cohesive zone model 968
cohesive-volumetric finite elements
(CVFE) 914
cold contact time 938
collinear interference 450
collision avoidance radar (CAR)
687
color code 709, 729
color stepping 725
colored interference fringe 462
common-path interferometer 461
compact disc (CD) 417
compatibility condition 734
complementary metal–oxide
semiconductor (CMOS) 567
complementary pattern 624
complex amplitude 470, 471
complex stress intensity factor 962
compliance 127
composite
– laminate 753, 755, 756
– material 97
Composite Materials Technical
Division (CMTD) 98
compression testing 103
compressor blade 759
computer-aided design (CAD) 685
computer-aided engineering (CAE)
685
computer-aided manufacturing
(CAM) 685
concentrated load 275
concrete 1002
concurrent engineering 685
condition experimental data
272
conductive
– polymer (CP) 920
confidence interval 268
confidence level 268
constant stress 293
constantan 291
constant-voltage excitation
285
constitutive formulation 171
constitutive response 934
constrained matching 585
contact 961
– AFM 413, 423
– stress 275, 704
continuous stiffness 396
continuous stiffness module (CSM)
81, 82
continuous time-average hologram
interferometry 680
continuous wave (CW) 680
continuum concept 569
contour 702
– map 601
contourable plastics 715
contours of displacement/strain/stress
701
convolution kernel 498
coordinate measuring machines
(CMMs) 685
coordinate system 569
coordinates 580
copper–nickel alloy 291
core testing 1006
correction factor 716
correlation 273
correlation coefficient 273, 274
corrosion test 1006
cosinusoidal fringe 680
cost-effective 1009
covariance matrix 543
cover test 1005
crack 1007
– closure 755
– growth 437, 438
– growth criteria 963
– initiation 438
– nucleation 966, 977
– opening displacement (COD)
145, 972
– opening interferometry (COI)
145, 971–973
– propagation 113, 438
Subject Index
D
damage 930, 1003
dark field 708
data
– acquisition 996
– correlation 753
– filtering 753
– format 753
– transmission 996
DC measurement 413
dead load 993
deep reactive-ion etching (DRIE)
210, 213, 848
deflection prediction 1006
deformation
– elastic 292
deformation measurement 566,
586, 589
deformed image 572, 586
degree of freedom 268, 277
delamination 108, 111, 112, 961,
979
delta rosette 322
Deltatherm 746
dependent 274
dependent variable 272
deployment 1009
Derjaguin–Muller–Toporov (DMT)
429
description of light 448
desktop Kolsky bar 941
destructive/failure test 991
detector
– infrared 745
Deutsches Institut für Normung
(DIN) 102
deviation ratio 272
diametric loading 364
diamond 208
– method 287
– pyramid hardness (DPH) 391
diamond-like carbon (DLC) 436,
795
dicyclopentadiene (DCPD) 111
difference between two means
270
diffraction
– at aperture 474
– by aperture 469
– by grid 469
– elastic constant (DEC) 805, 808
– problem 468
– theory 473
– theory history 470
digital
– photoelasticity 737
– speckle correlation (DSC) 658
– speckle pattern shearing
interferometry (DSPSI) 830
– speckle photography (DSP) 658
– speckle-pattern interferometry
(DSPI) 517
digital fringe multiplication 719
digital fringe thinning 719
digital holography 517
digital image
– correlation (DIC) 141, 220, 434,
566, 660, 845, 1034
– processing (DIP) 719
digital micromirror device (DMD)
221
– and adhesion 221
– and creep 221
digital photoelasticity 704
dilatometry 316
dipole 199
dip-pen nanolithography (DPN)
216
direct impact 930
direct problem 549
direction of illumination and
observation 681
directional
– beam-splitter (DBS) 683
directional coupler (DC)
681
directional filter 502
disaster 997
dislocation cross-slip
398
dispersion 273, 935
displacement 489
displacement vector 536
dissipative 34, 38, 39, 43
distance to neutral point (DNP)
646, 1032
distributed temperature sensing
(DTS) 367
distribution 260
distribution function 263
division of quantity 278
dodecyltrichlorosilane (DTS)
974
Doppler
– effect 464
– interferometry 466
– picture velocimetry (DPV) 468
– shift 465
– shift for reflected light 467
Doppler–Fizeau 464
double cantilever beam (DCB) 111,
126, 240
double refraction 704
double-exposure hologram
interferometry 680
dropweight 931
Dugdale–Barenblatt model
132
dummy compensation 101
dummy gage 301
dynamic 1009
– energy release rate 138
– failure 930
– fracture 953
– interface fracture 969
– matrix cracking 970
– mechanical analysis (DMA) 84
– photoelasticity 703, 735
– range 619, 620, 623
– stress intensity factor 138
dynamic/vibration load 994
Dynatup 593
Subject Index
crack path
– selection 964
– separation 965
– stability 965
crack tip 275
– deformation 438
– opening displacement (CTOD)
133
cracking 112
Cranz Schardin camera 714
creep 221, 930, 1001
– crack growth 140
critical
– energy release rate 112
– point 555
– stress intensity factor 131
cross-camera matching 582, 583
– constrained 582
– unconstrained 582
cross-coupling 421
cross-product term 274
cross-sectional area 873
crystal structure 17, 23–25, 27, 32,
33, 45
crystallographic texture 812
cubic spline 574
cumulative frequency 261
– diagram 261
cure reference method 120
current sensitive 288
cyanoacrylate 307
cyclic
– plasticity 745
cytoskeleton (CSK) 170
1085
1086
Subject Index
E
Subject Index
edge effect 750
eigenvalues 967
elastic
– anisotropy 804
– deformation 292
– precursor 946
– strain 801
elasticity 21, 36, 37
– tensor 770
elastic–plastic fracture mechanics
(EPFM) 132
elastodynamics 770
electric discharge machining (EDM)
383
electric vector 449
electrical analogy 735
electric-discharge machining (EDM)
210, 213
electroactive
– polymer (EAP) 917, 920
electromagnetic interference (EMI)
1016
electron beam
– moiré 108
electron-beam projection lithography
(EPL) 834
electronic
– structure 27
electronic noise 495
electronic packaging 688
electronic speckle pattern
interferometry (ESPI) 661, 824,
828, 830, 979
electroplating 211
electrostatic force microscopy 410
electrostatically stricted
– polymer (ESSP) 921
elementary circuit 285
elevated temperature analysis 758
elliptically polarized 704
elongation 307
emerging technique 816
emerging technology (ET) 675
emissivity 751
end-notched flexure (EFN) 113
energy 968
– critical release rate 112
energy release rate 963
engineering strain 284
epipolar constraint equation 583
equilibrium 28, 30, 31, 34, 35, 37,
38, 40, 43, 44, 46, 933
– condition 808
– equation 735
– metastable 29
– phase 17
– unstable 29
equivalent weight (EW) 189, 197
error factor 544
error in x-ray measurement 811
error propagation 278
estimating error 279
etching 212
– dry 212
– focused ion-beam, FIB 213
– plasma 213
– stiction 212
– wet 212
ethylene copolymer (ECO) 914
ethylenediamine pyrochatechol
(EDP) 212
Euler angle 571
European Structural Integrity Society
(ESIS) 999
excursion 402
expanding ring 953
experimental technique 986
expert system (ES) 378
extension 603, 607
extracellular matrix (ECM) 170
extraordinary 704
extrinsic
– Fabry–Pérot interferometer (EFPI)
357
extrinsic parameter 571
F
fabrication technique 361
Fabry–Pérot interferometer (EFPI)
– extrinsic 357
face slap 1009
face-centered cubic (fcc) 24
failure
– dynamic 930
fast axis 705
fast Fourier transform (FFT) 659,
747
fatigue 745
– analysis 382
– crack 756
– crack growth 140
– life 306, 371
fault 970
fiber
– Bragg grating (FBG) 361, 906
fiber optic sensor 351
– advantages 352
– cumulative 351
– discrete 351
– distributed 351
– extrinsic sensor 351
– intrinsic sensor 351
– limitation 353
– multiplexing 352
field analysis of data 275
field of view (FoV) 344
field test 1004
fill direction 1010
Fillers–Moonan–Tschoegl (FMT)
equation 69
film fracture 401
film polyimide 311
filter cascade 498
finite element (FE) 732
– analysis 1010
– method (FEM) modeling 696
fire 998, 1001
Fizeau interferometry 605
Flemion 188
flip-chip ball grid array (FC-BGA)
1033
flip-chip plastic ball grid array
621
floor truss 999
flow visualization 220
– technique 221
fluorescence 803
focal adhesion complex (FAC) 170,
842
focal length 567, 584
focal-plane array 746, 755
focused ion beam (FIB) 210, 213,
219, 220, 851, 852, 861
foil technology 291
folded spring 693
force measurement 416
force modulation microscopy (FMM)
431
force spectroscopy 410, 411, 432
force-displacement curve 411, 416,
432
forensic test 992
forward problem 231
Fourier transform method (FTE)
473, 492, 494, 510
fractional retardation 721, 724, 725,
732
fracture 745
– behavior 436
– dynamic 953
– mechanics 755, 961
– process zone 135
– resistance 127
– toughness 131
frame compliance 394
Subject Index
G
gage
– length 311
– misalignment 99
– selection 310
gage factor 293
– calibration 293
Galileo 986
galliumarsenide 208
gas turbine engine 753
Gaussian or normal distribution
function 263
Gaussian-kernel 498
generic interferometer 451, 452
geometric filter 503
geometry matrix 536
giant magneto resistance (GMR)
209
– material 209
glass 208
glass-fiber-reinforced epoxy 311
glass-reinforced plastic (GRP) 22
global positioning sensing (GPS)
691
gold 208
governing equation 276
gradient 813
grain statistics 812
graphical 709
grating pitch 361
grey-field polariscope (IR-GFP)
– infrared 971
group velocity 772
growth and remodeling (G&R) 180
growth factor (GF) 170
Guide of Uncertainty Measurement
(GUM) 535
guided elastic wave 774
guided wave
– in isotropic plate 775
– in multilayered structure 776
Gumbel 263
Gurson–Tvergaard–Needleman
model 136
H
half-fringe photoelasticity (HFP)
704, 719
half-wave plate (HWP) 705, 787
Hamaker constant 412
Hamiltonian system 555
hard material 208
hardness 390
harmonic oscillator 425, 426
harmonic plane wave 449
heat transfer 754
heat-affected zone (HAZ)
585, 688
Hertzian elastic model 403
heterogeneous 97
hexagonal close-packed (hcp)
24
high accuracy and precision 691
high density interconnect (HDI)
1038
high modulation 721
high rotational speed 688
high speed imaging 594
high strain rate 930, 987, 998
high strain rate pressure-shear
(HSRPS) 942
high stress gradient 747
high temperature 998
high temperature testing 938
higher-order 274
high-frequency 759
high-speed imaging 597
high-speed photography 949
high-speed video 1009
high-temperature 987, 999
high-temperature storage (HTS)
650
histogram 261, 579
hole-drilling method 118
hologram
– interferometry 680
– recording setup 678
holographic nondestructive
evaluation (HNDE) 483
holographic nondestructive testing
(HNDT) 547
homogeneous dislocation nucleation
403
homomorphic filtering 502, 505
Hooke’s law 989
hoop stress 321
Hugoniot 947
Hutchinson–Rice–Rosengreen (HRR)
field 134
Huygens’ principle 458, 470
hydrogel 209
hydrophilic
– surface 432
hydrophobic
– surface 432
hypergeometric 263
hypervelocity impact 929
hypothesis 278
– rejected region 278
hysteresis 420, 433
Subject Index
Fraunhofer 472
– approximation 473
– limitation 476
free edge effect 114
free filament 332
freestanding test film 435
frequency 602, 607–610, 614–616,
705
– distribution 260, 261
– domain 719
– modulation (FM) 427, 467
friction 220, 935
– measurement technique 220
friction stir welds (FSWs) 585
fringe 706
– color sequence 463
– contour 733, 736
– contrast 491, 515, 618
– counting 463
– direction map 502, 521
– interpolation 973
– localization 684
– multiplication factor 624
– numbering 525
– order 455, 463, 605, 606, 609,
610, 612, 615, 624, 625, 709
– pattern 454
– shifting 610
– thinning 720
– vector 684
fringe-counting problem 522
fringe-locus function 681
fringe-tracking 492, 509
fringe-vector theory 684
frozen fringe 680
frozen stress photoelasticity
702
full bridge 303
full field of view (FFV) 697
fullerene 210
full-field
– strain measurement 432
– technique 996
full-scale test 991
full-wave plate 705
fully specified problem 231, 232,
255
function
– characteristic 485
functional operation 688
functionally graded material (FGM)
910, 911
functions of operating condition
692
fused deposition modeling (FDM)
732
1087
1088
Subject Index
I
Subject Index
I-beam cantilever 414
identification problems 550
IITRI compression fixture 104
ill-conditioned problem 231, 233,
234
ill-posed 531
image 569
– based optimization 580
– center 597
– digitization 565
– distortion 571, 579, 585
– processing (IP) 681, 682
imaging 817
– artifact 410, 420
– model 565, 573
impact 929, 998, 1000, 1004
impact hammer 1004
impulsive loading force 689
impulsive stimulated thermal
scattering (ISTS) 795
in situ AFM/DIC method 438
in situ mechanical testing 434
incremental hole drilling 119
indentation fracture 399
indentation size effect 402
independent camera calibration for
stereo-system 582
independent variable 273, 274
index of refraction 451
indicated strain 294
inertial effect 936
inertial measurement unit (IMU)
691
inertial sensor 691
infrared
– detector 745
– grey-field polariscope (IR-GFP)
971
– radiometer 743
in-plane displacement 607
input/output (I/O) 1016
instrumentation 996
integrated circuit (IC) 688, 1018
integrated photoelasticity 703, 735
intensity 451, 472
– interpolation 573
intercept 272
interface crack 962
interface fracture 977
– dynamic 969
interfacial
– force microscope (IFM) 980
– fracture 961
– toughness 964
interference 449
– fringe 455
– fringe cycle 455
interferometer 354, 451, 681
– confocal Fabry–Pérot 785
– dynamic holographic 786
– Fabry–Pérot 357
– Mach–Zehnder 354, 357
– Michelson 354, 357, 785, 786
– photorefractive two-wave mixing
787
– polarization 358
– reference-beam 785
interferometric measurement
413
interferometric strain/displacement
gage (ISDG) 154, 844
interferometry 143
– by amplitude division 457
– by wavefront division 456
interlaminar 97, 111
– compression 114
– fracture 111
intermittent contact AFM 425
intermittent contact mode 431
International Building Code (IBC)
993
International Organization for
Standardization (ISO) 131
interphase 108
interrogation of FBG sensors
366
intrinsic 582
– calibration parameter 582
– camera parameter 582
– unknown 582
inverse hole problem 436
inverse method 231
inverse problem 231, 240, 531, 549
– in mechanics 436
inverse transform 477
ion exchange capacity (IEC) 188
ionic polymer gel (IPG) 920
ionomeric polymer–metal composite
(IPMC) 187, 920
Iosipescu 105
– specimen 105
– strain gage 106
irradiance 451, 472
isochromatic 255, 702, 707, 717
– fringe 142
– isoclinic interaction 720
isoclinic 702, 707, 717, 725
isoelastic 310
isopachic 744
isotropic point 709
J
Japanese Industrial Standard (JIS)
103
J-integral 112, 755, 964
Jones calculus 707
Jones matrix 712
K
kaleidoscope 731
Kalthoff experiment 953
Karma 291
K-dominant zone 962
kinetics 28
kink band formation 108
Kolsky bar 931
L
Lagrangian large strain 591
Lamb wave 775
– tomographic imaging 791
laminate
– composite 753, 755, 756
– warpage 120
large-aperture diffraction 476
laser Doppler velocimetry (LDV)
464, 468
laser Doppler vibrometer (LDV)
468, 834
laser occlusive radius detector
(LORD) 939
laser ultrasonic 769
laser-based corneal reshaping
(LASIK) 177
lateral force AFM 410
lead lanthanum zirconate titanate
(PLZT) 161
lead zirconate titanate (PZT) 209
leadwire
– attenuation 305
– system 301
least
– square 709
least-squares
– method 272
– minimization process 276
left-handedly polarized 705
Lennard–Jones
– force 429
– potential 412
lens 589
Leonardo da Vinci 986
level of significance 271
Levenberg–Marquardt 573, 576
Subject Index
M
Mach–Zehnder interferometer 362
macrostress 807
magnetic force microscopy (MFM)
410, 431
management approach 990
manufacturer’s gage factor 296
marine application 367
material
– characterization 770
– composite 97
– fault 546
– model 1002
– property characterization 97
– stress fringe value 706, 709, 714
– test 992
MATLAB 276
matrix
– algebra 275
– method 275
matrix cracking
– dynamic 970
maximum error 279
maximum tangential stress criterion
132
Maxwell’s equations 449
mean deviation 262
mean stress effect 757
measurement error 264, 272
measurement geometry 803
measurement technique 219
– bending 219
– buckling 219
– bulge test 219
– focused ion beam (FIB) 220
– optical interferometry 219
– resonant frequency 219
measures of central tendency 262
measures of dispersion are 262
mechanical analysis (DMA)
– dynamic 84
mechanical behavior 435
mechanical propertie
– measurement 436
– of material 690
– of MEMS 435
mechanical strain measurement 439
median 262
median filter 499
median filtering 529
MEMS 435, 436
– application 204
– biological 205
– commercialization 205
– definition 204
– fabrication 206
– market 204
– material 206
– microfluidic 205
MEMS/NEMS
– adhesion 220
– device characterization 218
– experimental mechanics 217
– fabrication 211, 215
– flow visualization 220
– friction 220
– influence of scale 217
– mechanics issue 221
– microcantilever sensor 222
– micromachining 210
– packaging 216
– residual stress 219
MEMS/NEMS device 221
– adhesion 220
– biomolecular recognition 222
– Digital Micromirror DeviceTM
(DMD) 221
– flow visualization 220
– friction 220
– residual stress 219
– thermomechanical data storage
223
– wafer bonding 220
MEMS/NEMS fabrication
– deposition 211
– die-attach process 217
– dip-pen lithography 216
– electron-beam lithography 216
– etching 212
– lithography 211
– microcontact printing 215
– nanolithography 216
– nanomachining 216
– packaging 216
– scanning tunneling microscope
216
– self-assembly 215
– soft lithography 215
– strategies for NEMS 215
– wafer bonding 214
MEMS/NEMS material
– active material 209
– amorphous silicon 207
– buckyball 210
– carbon nanotube 210
– ceramics 206
– diamond 208
– fullerene 210
– gallium arsenide 208
– giant-magnetoresistive material
209
– glass 208
– hydrogel 209
– lead zirconate titanate 209
– metal 208
Subject Index
light-emitting diode (LED) 359,
881
lightweight automotive airbag 1009
limiting crack speed 138
linear elastic fracture mechanics
(LEFM) 126
linear regression analysis 272
linear variable differential
transformer (LVDT) 76, 337, 989
linearity error 290
linearization of the PZT actuator
422
linearizing governing equation 276
linearly elastic fracture mechanics
(LEFM) 131
linearly or plane polarized 704
liquid crystal elastomer (LCE) 920
lithography 211
– e-beam 212
– galvanoforming molding (LIGA)
214
– ion beam 212
– mask 212
– optical 212
– photoresist 212
– soft lithography 215
– x-ray 212
live fringe pattern 680
Lloyd mirror technique 362
Lloyd’s mirror 455
load
– stepping 724, 725
– test 991, 1006
– testing 1003
loading
– equipment 995
– frequency 752
– on structure 993
– systems 995
local area networks (LANs) 348
local deformation 434
local heating 379
local least squares smoothing 587
lock-in analyzer 746, 747
longitudinal wave 771
long-period grating (LPG) 367
long-range force 411
long-working-distance microscope
(LMO) 683
low pressure CVD (LPCVD) 211
low-frequency cutoff value 286
1089
1090
Subject Index
Subject Index
– nanomaterial 209
– nanowire 210
– NiTi 209
– permalloy 209
– photoresist 208
– piezoelectric material 209
– polydimethylsiloxane 209
– polymer 208
– polysilicon 207
– quantum material 210
– quartz 208
– shape-memory material 209
– silicon 207
– silicon carbide 208
– silicon dioxide 208
– silicon nitride 208
– silicon on insulator 208
metal matrix composite (MMC) 22
method of computing 279
method of least squares 274
Michelson interferometry 459
micro alloyed 1001
microcantilever sensor 222
microcracking 108
micro-electromechanical system
(MEMS) 111, 160, 203, 434,
675, 840, 918, 961
microencapsulated healing agent
111
microengine 688
microfluidic device 205
– application 205
microgyroscope 691
micromachining 210
– bulk micromachining 213
– chemical vapor deposition (CVD)
211
– deposition 211
– electroplating 211
– etching 212
– LIGA 214
– lithography 211
– physical vapor deposition (PVD)
211
– sol gel deposition 211
– spin casting 211
– surface micromachining 214
micromagnetics 166
micromechanics 97, 107
micro-optoelectromechanical system
(MOEMS) 688
microparticle image velocimetry
(μPIV) 221
microscale 217
– and continuum mechanics 218
microscale tension specimen 436
microscope objective (MO) 681
microstress 807
microstructure 17, 18, 21, 28, 29,
32, 45, 46
Miller indices 325
milling machine 611
Millipede 223, 438
– memory 411
Ministry of International Trade and
Industry (MITI) 103
misalignment error 319
mismatch of Poisson’s ratio 716,
734
mismatch of quarter wave plate 722
mixed-mode fracture 276, 436, 962
mixed-mode loading 132
mode 262
– I fracture 436
– I interlaminar fracture toughness
111
– II fracture toughness 113
– mix 963
model-based simulation (MBS) 987
modeling 985
modified total internal reflection
(M-TIR) 350
modified Wyoming shear test fixture
106
modulation 721
Mohr’s circle 314
moiré
– electron beam 108
moiré interferometry 114, 977
moiré pattern 308
monochrome fringe 462
monolithic integration 688
morphotropic phase boundary (MPB)
166
most probable characteristics strength
(MPCS) 1005
motion compensation 750
motion measurement 568, 577
moving fringe 467
multifunction nanotubes 1013
multiple-wavelength optical
contouring 682
multiplication of quantities 278
multiplicative intensities 603
multipoint overdeterministic method
(MPODM) 755
multivariate regression 274
multiwalled carbon nanotube
(MWCNT) 110, 850
multiwalled nanotube (MWNT)
841
muscle 188
muscle activation 177
N
Nafion 187, 188, 198, 199
nail test 706
nanocomposite 109
nanocrystalline (NC) 841
nano-electromechanical system
(NEMS) 203
nano-electromechanical system
NEMS
– application 204, 205
– biologcal 205
– commercialization 205
– definition 204
– fabrication 206
– market 204
– material 206
nanofiber 109
nanoindentation 411
nanolithography 216, 410, 438
nanomachining 216
nanomaterial 209
nanometer accuracy 690
nanometer spatial resolution 434
nanometer-scale mechanical
deformation 435
nanoparticle 109, 798
nanoscale 217
– and continuum mechanics 218
– mechanical measurement 435
nanotube 109, 841
nanowire 210
National Environmental Policy Act
(NEPA) 990
National Highways Development
Project (NHDP) 1002
National Institute of Standard and
Technology (NIST) 987
National Science Foundation (NSF)
986
natural light 704
nature of light 448
Navier 988
NC-AFM 426, 431
NC-AFM imaging 413
near-field scanning optical
microscopy (NSOM) 409
Newton’s fringes 456
Newton–Raphson 573, 576
nickel 208
nickel–chrome alloy 291
Nikon 589
Nikon lens 586
NiTi 209
Subject Index
O
object 683
– beam 678
– coordinate system 569
objective function 572
oblique
– incidence 735, 736
– interference 453
– projection 683
Occupational Safety and Health
Administration (OSHA) 990
offset yield 999
Ohm’s law 285
ohm-meter 285
oil and gas application 367
one-sided Hopkinson bar (OSHB)
245
open system 995
open-hole tension specimen 107
operations per second (OPS) 986
optic axis 704
optical coherence 356
optical computers 702
optical detection of ultrasound
– practical consideration 789
optical Doppler interferometry 464
optical equivalence 712, 713
optical fiber 348
– cladding 348
– core 348
– cutoff wavelength 349
– multimode 350
– singlemode 348
– V number 349
optical fiber coupler 352
optical Fourier processing 478
optical Fourier transform 473
optical frequency-domain
reflectometry (OFDR) 364, 366
optical indicatrix 356, 363
optical interferometry 785
optical nondestructive testing
(ONDT) 547
optical path length 452
optical response 362
optical spectrum analyzer 477
optical transform lens 476
optical/digital fringe multiplication
(O/DFM) 624
optimal pattern 579
optimization 573, 575, 576
optimized interferometer 538
optoacoustic 769
optoelectronic fringe interpolation
684
optoelectronic holography (OEH)
675, 681
optoelectronic laser interferometric
microscope (OELIM) 675, 682
orbit 555
organic matrix composite (OMC)
22
Organisation Internationale de
Metrologie Legale (OIML) 284
orientation distribution function
(ODF) 35
orientation imaging microscopy
(OIM) 33, 398
orthotropic material 745, 749, 753
out-of-plane displacement 979
overdeterministic set of linear
equations 275
P
packaging 216, 691
paper gage 291
parallax 679
parameter
– characteristic 713
partial load test 991
partially destructive 1002, 1006
partially specified problem 231
particle image velocimetry (PIV)
221
patching/stitching of tiles 686
path length (PL) 451, 471
– difference (PLD) 355, 452, 454,
457, 460, 471
pattern matching 565
Pb(Mgx Nb1−x )O3 (PMN) 162
peak position determination 806,
807
penetration depth 804, 805
periodic excitation 684
permalloy 209
perturbation theory of linear equation
systems 538
phantom 594
phase 485
– ambiguity 359
– angle 471
– derivative variance 728
– detection 358
– difference 489, 705, 752
– imaging 430
– information 753
– mask 362
– matching condition 362
– measurement interferometry 495
– retrieval 492, 507
– retrieval technique 506
– sampling method 514
– shift 753
– shifting 720, 725
– shifting method 492
– shifting/polarization stepping 725
– stepping 624–626
– unwrapping 723
– velocity scanning (PVS) 795
phosphate-buffered saline (PBS)
875
photoacoustic 769
– application of 789
– biomedical 798
– in multilayered structure 779
– Lamb wave generation 779
– longitudinal and shear wave
generation 777
– nondestructive imaging of structure
789
– Rayleigh wave generation 778
– spectroscopy 798
Subject Index
noise detection 290
non-adiabacity 744, 751
non-contact AFM (NC-AFM) 411,
412, 425
non-coplanar surface 622
nondestructive inspection 546
nondestructive testing (NDT/NDI)
655, 668, 676
non-destructive testing or evaluation
(NDT/NDE) 668
nondissipative 39
nonlinear 968
– code Abaqus 1010
– filter 499
– least-squares method 275
– optimization 573
nonlinearity 289
non-standard data 815
normal crack opening displacement
(NCOD) 971
normal distribution 267
normal matrix 536
normal projection 683
normal strain 313
normal velocity interferometer (NVI)
943
normalization 504
normalized cross-correlation 576,
577
notch filter 759
n-type 326
nulled 290
numerical aperture (NA) 349
1091
1092
Subject Index
Subject Index
photoacoustic generation 777
– bulk-wave 782
– guided-wave 780
– model 780
– practical consideration 783
photoacoustic method
– for materials characterization 793
– material anisotropy 793
– mechanical properties of coating
795
– mechanical properties of thin film
796
photodetector 413
– responsivity 746
photodiode 413
photoelastic coating 703
photoelastic constant 356, 363
photoelasticity 756, 969–971, 978
– digital 737
– dynamic 703, 735
photon detector 744, 746
photonic-bandgap fiber (PBG) 350
photonic-crystal fiber (PCF) 350
photo-orthotropic elasticity 703
photoplasticity 703, 735
photopolymer 733
photorefractive crystal (PRC) 787
photoresists 208, 212
photosensitivity 361
physical vapor deposition (PVD)
210, 211
picosecond ultrasonic 782
piezoelectric 411
– actuator 419
– effect 420
– material 209
– scanner 412
– sensing 414
– transducer (PZT) 666
piezoresistance 325
pinhole 618, 619
– camera 469
– model parameter estimation 572
– projection 573
– projection imaging model 569
– projection model 571
pixel 569
Planck’s law 745
plane polariscope 706, 707
plane wave 449
– unbounded anisotropic media 772
– unbounded isotropic media 771
– unbounded media 771
planning and control 993
plasma-enhanced chemical vapor
deposition (PECVD) 210, 211
plastic deformation 293, 801
plastic quad flat package (PQFP)
648
plastic zone 129, 397
plasticity 39, 40
– cyclic 745
plate 292
plated-through-holes (PTH) 652
point of observation 683
point source of illumination 683
point spread function (PSF) 657
point techniques 996
point-spread function 488
Poisson ratio 98, 263, 295, 436, 980
polariscope 705, 730
polarization 704
– maintaining (PM) 358
– maintaining fiber (PM fiber) 350
polarized light 704
polarizer 712
polarizing beam splitter (PBS) 788
poleidoscope 731
polycarbonate (PC) 84, 756
polycrystalline lead zirconate titanate
(PZT) 419
polycrystalline silicon 435
polydimethylsiloxane (PDMS) 206,
209
polylactic acid (PLA) 906
polymer
– conductive (CP) 920
– electrostatically stricted (ESSP)
921
polymer (EAP)
– electroactive 917, 920
polymer matrix composite (PMC)
22
polymeric material 438
polymethyl methacrylate (PMMA)
84, 146, 223
polysilicon 207, 435, 436
– fracture 438
polyvinyl chloride (PVC) 752
polyvinylidene fluoride (PVDF)
209
pop in 402
position vector 678
positive definite 234
postprocessing of fringe patterns
521
post-yield 307
potential drop method 155
potential energy release 127
potentiometer circuit 286
power density 308
power meter (PM) 682
power-law constitutive model 134
precursor
– elastic 946
pressure
– shear 942
– transducer 1009
– vessel 321
prestressed concrete longitudinal
girders 1004
primary characteristic direction 712
principal strain 295
principal stress 295
– difference 702
– orientation 702
printed circuit board (PCB) 1018
probabilistic load 994
probability 264
– distribution function 259, 279
– of failure 267, 271
process simulation 685
projected grating 979
projected quantity 278
projection matrix 683
projection moiré 611
property 739
– dissipative 17
– equilibrium 17
– of MEMS 435
– transport 17
proportional damping 238
proportional-integral-derivative (PID)
controller 430
p-type 326
pulse velocity 1005
pulsed beam of light 680
pulse-echo (PE) 1022
pure shear strain 312
PVDF (polyvinylidene fluoride)
161
PZT (lead zirconate titanate) 161
– actuator 418
– actuator nonlinearity 420
– nonlinearity 422
– scanner 419
– scanner creep 421
Q
quad flat pack (QFP) 1022
quality
– control 685
– factor 426
– map 728
– measure 728
quantum material 210
quarter bridge 290
Subject Index
quarter-wave plate 705
– mismatch 723
quartz 208
quasistatic 930, 1009, 1010
– interface fracture 970
R
S
sacrificial surface micromachining
(SSM) 688
saddle point 709
safety 990
– factor 271
sample mean 262
sample size 270
sampled linear least squares method
709
sample-related error 812
sampling frequency 529
Sandia National Laboratories (SNL)
688, 986
Sandia’s Ultraplanar MEMS
Multilevel Technology
R
) 688
(SUMMiT
sandwich 964
scale parameter 266
scaled/model test 991
scaling law 217
scanner nonlinearity 435
scanning acoustic microscopy (SAM)
1022
scanning electron microscope (SEM)
108, 220, 410, 845, 979
scanning electron microscopy (SEM)
31, 1035
scanning force microscopy 411
scanning laser source (SLS) 793
– imaging of surface-breaking flaws
792
scanning near field optical
microscopy (NSOM) 431
scanning probe microscopy (SPM)
409, 1035
scanning thermal microscopy
410
scanning tunneling microscopy
(STM) 216, 409, 410
scattered light photoelasticity 703,
735
scientific database 1003
secondary principal stress 710
seed point 727
segmentation of fringe patterns 521
self heating 101
self-assembled monolayer (SAM)
210, 215, 974
self-assembly 215
self-healing polymer 111
self-heating 286, 308
self-temperature compensation
(S-T-C) 101, 300
semiconductor gage 325
sensitivity 748, 755
– response 241, 242
– response method (SRM) 232,
235, 236
– vector 681
sensor 569
– coordinate system 569
– wavelength overlap 365
separate-path interferometer
461
serial multiplexing 364
shading correction 504
shadow moiré 611, 612, 614–619,
621, 623, 624, 626, 980
shape measurement 583, 584
shape memory material 209
shape-memory alloy (SMA) 209,
224, 900, 909, 910, 918
shear
– band 952
– difference 735
– testing 105
– wave 771
Subject Index
radiofrequency (RF) switch 694
radiometer
– infrared 743
random loading 759
random noise 727
random variation 271, 274
range 262
– dynamic 619, 620, 623
rank deficient matrix 234
rank filter 499
rapid prototyping (RP) 685, 704,
732, 734, 737
rapid tooling (RT) 732, 734
rating analysis 1007
Rayleigh wave 714, 772
– on anisotropic crystals 774
– on isotropic media 773
RC circuit 286
reactive-ion enhanced etching (RIE)
210
real-time hologram interferometry
680
recognition by synthesis 550
reconstruction of a hologram 678
rectangular rosette 322
reference
– beam 678
– frequency 747
– image 576
– signal 751, 752
refined TFP (RTFP) 730
reflection artefact 750
reflection photoelasticity 715, 735
refractive index 451
regression analysis 272
regularization 550
regularized phase tracking (RPT)
509
reinforced cement concrete (RCC)
1005
relation
– characteristic 932
reliability 271
replamineform inspired bone
structure (RIBS) 923
representative volume element (RVE)
42, 435
repulsive force 412
residual birefringence 710
residual stress (RS) 117, 372, 692,
704, 712, 731, 733, 745, 757, 801
– and failure 219
– in films 219
– management (RSM) 373
– measurement 97, 372
– modification 383
resistive grid method 155
resistivity 292
resonance frequency 425
Resource Conservation and Recovery
Act (RCRA) 990
response diagram 934
retardation
– characteristic 712
retardation matrix 707
retarder 704, 707, 712
retreating side 586
reverse engineering 685
RGB photoelasticity (RGBP) 463,
727, 730
right-handedly polarized 705
rigid body 582
ring-down method 426
rolling contact fatigue (RCF) 815
room temperature 1001
rotation 603, 604, 607
– characteristic 712
– matrix 707
rotational speed 688
rotator 712
1093
1094
Subject Index
Subject Index
shearography or speckle pattern
shearing interferometry (SPSI)
830
shear-web transducer 316
shock wave 946
short-range force 411
signal conditioning 997
signal-to-noise ratio (SNR) 429,
435, 484, 496, 751, 753, 758
silicon 207
– carbide 208
– dioxide 208
– nitride 208
– on insulator (SOI) 208
simulation 985, 995
sinc function 475
single-crystal silicon 325
single-grain studies 816
single-plane rosette 311
single-walled carbon nanotube
(SWCNT) 850
single-walled nanotube (SWNT)
841
singular matrix 232
singular point 709
singular stress 966
singularity 967, 975, 976, 978
sink 709
sinusoid fitting 514
skeleton method 509
skeletonizing 504
skew factor 570
slicing plan 712
slip 970
slope 272
– parameter 267
– parameter (modulus) 266
slow axis 705
small section
– tile 686
small-scale yielding
130
Sn-Ag-Cu (SAC) 1036
snap-in instability 432
snap-off instability 433
Snell’s law 704
Society for Experimental Mechanics
(SEM) 284, 371
sol gel deposition 211
solderability 310
source 709
space–bandwidth product (SPB)
484
spall strength 951
spallation 951
SPATE 744, 745, 748, 755, 758
spatial
– domain 719
– filtering 478, 497
– frequency 473, 477
– phase shifting (SPS) 667
– resolution 434, 748
– signal 477
specifications 991
specified reliability 269
speckle 496, 978
– correlation (SC) 658, 660
– digital correlation (DSC) 658
– digital pattern interferometry
(DSPI) 517
– digital pattern shearing
interferometry (DSPSI) 830
– digital photography (DSP) 658
– effect 489
– interferometry (SI) 660
– pattern shearing interferometry
(SPSI) 662
– photography (SP) 658
– size 490, 579
speed imaging 594
spherical cavity model 397
spin casting 211
split-Hopkinson pressure bar (SHPB)
109, 931
stable configuration 692
stacked rosette 311
staircase yielding 403
standard 1009
standard deviation (SD) 262, 278,
1005
standard error 268, 279
staring arrays 746
state-of-the-art (SOTA) 676
statistical error analysis 542
STC mismatch 301
Stefan–Boltzmann constant
746
stereo rig 581, 582, 590
stereolithography (STL)
733
stiffness 198, 1010
stitched composite 112
stitching 1012
strain 684, 873
– elastic 801
– field 411
– gage 98, 151, 245
– measurement 434, 580
– of the indentation 390
– rate 929, 987
– rate sensitivity 1000
– tensor 770
strain–optic
– effect 355
– law 715, 717, 718
– tensor 356, 363
strain-optic
– coefficient 715
streamline fillet 702
strength 271
stress 271
– assisted corrosion 140
– concentration factor (SCF) 702,
712, 716
– contact 275, 704
– critical intensity factor 131
– dynamic intensity factor 138
– freezing 710
– gradient 747
– intensity factor (SIF) 129, 438,
702, 712, 755, 974
– intensity factor separation 965
– optic coefficient 706
– optic law 706, 712, 714, 717
– pattern analysis (by measurement
of) thermal emission (SPATE)
744
– separation 735, 756
– tensor 770
– wave 769
– wave or shock wave 929
stroboscopic illumination 689
stroboscopic time-average hologram
interferometry 680
structural system 985
structural test (ST) 985
structure
– electronic 27
structure data file (SDF) 237
Student’s t
– distribution 263, 268
subcritical crack growth 438
subpixel 565
subset shape function 587
subset-based image correlation 575
subset-level pattern matching 587
sub-slice 736
subtractive moiré 605
superimposed load 993
superlattice 798
supersensitivity 306
supply voltage 288
support bracket 753
surface
– center of expansion (SCOE) 781
– coating 748
– curvature 301
– hydrophilic 432
Subject Index
– hydrophobic 432
– roughness 435
– wave 772, 1005
surface acoustic wave (SAW) 784,
795
– flaw imaging 789
synchrotron 815
– and neutron facilities 810
synthetic-aperture radar (SAR) 497
systematic errors 811
T
– sensitivity 294
– sensitivity correction 98
Tresca 703
TrFE (trifluoroethylene) 161
triaxial analysis 805
triaxial stress measurement 814
tricolor light 732
tripod 567
true arithmetic mean 262
TSA stress gage 756
T-stress 966
tunneling 413
– current 409
– electron microscope (TEM) 111
twisting of the transverse girder
1004
two-beam interferometer 144
two-dimensional 572
two-way shape memory effect
(TWSME) 918
Twyman–Green interferometer 460
U
ULE titanium silicate 317
ultra-high vacuum (UHV) 424, 427,
431
ultrasonic
– computerized complex (UCC)
378
– (hammer) peening (UP) 383
– method 377
– peening (UP) 376
– test 1005
ultrasound
– laser generation of 770
– optical detection of 770, 783
ultraviolet 212
unbalanced mode 290
uncertainty 690
uniaxial
– optical crystal 148
– strain 294
– stress 294
unidirectional composite 100
uniformly distributed load (UDL)
995, 1004
unit 238
universal precaution 871
unwrapping 526, 727
V
van der Waals 411
– forces 428
– interaction 428
Subject Index
Talbot distance 604, 617–621, 623
Talbot effect 617–619
Taylor impact 949
Taylor series expansion 276
Tb0.3 Dy0.7 Fe2 (Terfenol-D) 166
TC of gage factor 298
tee rosette 322
temperature
– change 744, 745
– coefficient of expansion 297
– coefficient of gage factor 297
– coefficient of resistance 297
– compensation 100
– testing 938
temporal filtering 497
temporal phase shifting 516
temporal phase shifting (TPS)
666
temporal phase unwrapping 532
tendon 1004
tension Kolsky bar 938
tension testing 103
tension–torsion 565, 588, 590
terminology 284
test control 996
test preparation 993
tetrabutylammonium, TBA+ 187
tetramethylammonium hydroxide
(TMAH) 212
textile composite 97, 114
TFE (tetrafluoroethylene) 161
theoretical background 962
theoretical mechanics 988
thermal
– apparent strain 354
– barrier coating (TBC) 909
– evaluation for residual stress
analysis (TERSA) 757
– interface material (TIM) 1020,
1041
– load 993
– management 688, 692
– output 298
thermally induced apparent strain
298
thermocouple effect 290
thermodynamic 37, 43
– principle 743
thermoelastic effect 744
thermoelastic stress analysis (TSA)
743
thermoelasticity 744
thermoelectric cooler (TEC) 650
thermomechanical (TM) 687
thermomechanical data storage
device 223
thin film 782, 979
– residual stress 219
three-dimensional 975, 976
– photoelasticity 703, 710
three-fringe photoelasticity (TFP)
727, 730
threshold 720
– strength 267
through scan (TS) 1022
time division multiplexing (TDM)
364, 365
time-average hologram
interferometry 680
tip imaging artifacts 417
tip shape convolution 418
tip shape deconvolution 418
tissue
– elasticity 172
– growth and remodeling 178
– poroelasticity 176
– viscoelasticity 176
top-down strategy 551
torsional Kolsky bar 940
torsional spring constant 414
total internal reflection (TIR)
348
traction–separation laws 974
trade-off curve 234
traffic survey 1004
transform lens 477
transient deformations 687
transient heating 687
transmission electron microscope
(TEM) 410, 846
transmission electron microscopy
(TEM) 31, 33
transmission photoelasticity 705
transport 27, 34, 43–45
transpose of a matrix 681
transverse
– displacement interferometer (TDI)
943
– load 364
1095
1096
Subject Index
Subject Index
variable-amplitude loading 759
variance 262
vector loop equations (VLE)
684
velocity interferometer system for
any reflector (VISAR) 949
vibration analysis 757
Vickers hardness 391
video dimension analysis (VDA)
874
virtual crack closure (VCCT) 251
VISAR 948
viscoelasticity 39
viscoplasticity 40
visibility 602, 604, 605, 613, 616,
620, 622
visual assessment 1003
v-notch (Iosipescu) specimen
316
voltage injection 290
voltage-sensitive deflection-bridge
circuit 288
von Mises 703, 712
V-shaped cantilever 414, 415
W
wafer bonding 214
– integrity 220
warp direction 1010
warpage
– laminate 120
wave 239
– equation 449
– interference 450
– plate 705
– theory 448
wavefront division 456, 459
wavelength division multiplexing
365
wavelength meter (WM)
682
wavelength-domain multiplexing
(WDM) 364
wavenumber 471
wavepropagation 930, 932
Weibull 263
– distribution 265
– distribution function 265
– parameter 266, 267
welded element 371
welding residual stress 371
well-posedness 550
Wheatstone bridge circuit 287
white light interference 463
whole-field interferometry 453
Wiener filtering 499
Williams, Landel, and Ferry 67
wind load 994
wind power application 368
windowed Fourier transform (WFT)
503
wire-wound resistor
291
WLF equation 67
world coordinate system (WCS)
569
World Trade Center (WTC) 985,
987, 997
X
x-ray 801
– attenuation 802–804
– detector 810
– diffractometer 809
Y
yield strain 757
yield strength 997, 999
Young’s fringes 458
Young’s modulus 237, 251, 436
Z
zero drift 302
zero shift 306
zero strength 266
zeroth order fringe 709