Previous Proceedings in the Series of Conferences on
Characterization and Metrology for ULSI Technology
Year
Title
Publisher
ISBN
2000
Characterization and Metrology
for ULSI Technology
AIP Conf. Proceedings vol. 550
1-56396-967-X
1998
Characterization and Metrology
for ULSI Technology
AIP Conf. Proceedings vol. 449
1-56396-753-7
1995
Semiconductor Characterization: AIP Press
Present Status and Future Needs
1-56396-503-8
Other Related Titles from AIP Conference Proceedings
684
Temperature: Its Measurement and Control in Science and Industry; Volume Seven
Edited by Dean C. Ripple, September 2003, 0-7354-0153-5
657
Review of Progress in Quantitative Nondestructive Evaluation: Volume 22
Edited by Donald O. Thompson and Dale E. Chimenti, March 2003,
2 vol. hard cover set, CD-ROM included, 0-7354-0117-9
612
Stress Induced Phenomena in Metallization: Sixth International Workshop on
Stress Induced Phenomena in Metallization
Edited by Shefford P. Baker, Matti A. Korhonen, Eduard Arzt, and Paul S. Ho, April 2002,
0-7354-0058-X
591
Electronic Properties of Molecular Nanostructures: XV International
Winterschool/Euroconference
Edited by Hans Kuzmany, Jorg Fink, Michael Mehring, and Siegmar Roth, November 2001,
0-7354-0033-4
590
Nanonetwork Materials: Fullerenes, Nanotubes, and Related Systems, ISNM 2001
Edited by Susumu Saito, Tsuneya Ando, Yoshihiro Iwasa, Koichi Kikuchi, Mototada Kobayashi, and
Yahachi Saito, October 2001, 0-7354-0032-6
497
Nondestructive Characterization of Materials IX
Edited by Robert E. Green, Jr., December 1999, 1-56396-911-4
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